Initiating and monitoring the evolution of single electrons within atom-defined structures

Scanning probe microscopes are now used routinely to engineer atomically precise structures. Their high sensitivity also permits their use in the study of single electron charging events. Here we present a study that combines both features of scanning probe microscopes to monitor single electrons confined to structures designed from up to six dangling bonds on the silicon surface. A new technique to controllably initialize specific charge configurations of dangling bond structures based on a mechanical mechanism is also presented.