Initiating and monitoring the evolution of single electrons within atom-defined structures

4 October, 2018 @ 3:00 pm

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Scanning probe microscopes are now used routinely to engineer atomically precise structures. Their high sensitivity also permits their use in the study of single electron charging events. Here we present a study that combines both features of scanning probe microscopes to monitor single electrons confined to structures designed from up to six dangling bonds on the silicon surface. A new technique to controllably initialize specific charge configurations of dangling bond structures based on a mechanical mechanism is also presented.


4 October, 2018
3:00 pm


Old Main Building, UNSW
Room G59, Old Main Building, UNSW Kensington Campus NSW Australia


University of New South Wales